X-ray analysis refers to the analysis method with X-ray as radiation source, mainly including X-ray absorption method, X-ray fluorescence method, X-ray diffraction method, etc. X-ray fluorescence (XRF) is widely used in composition analysis and X-ray diffraction (XRD) is widely used in structural analysis.

BEIJING HAMAMATSU PHOTON TECHNIQUE INC. can provide scintillators and scintillation detector products for X-ray diffraction to detect the microstructure and structural defects of materials.